{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,16]],"date-time":"2026-03-16T10:07:36Z","timestamp":1773655656271,"version":"3.50.1"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2016,10]]},"DOI":"10.1109\/ewdts.2016.7807694","type":"proceedings-article","created":{"date-parts":[[2017,1,9]],"date-time":"2017-01-09T21:42:59Z","timestamp":1483998179000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Pseudo-exhaustive testing of sequential circuits for multiple stuck-at faults"],"prefix":"10.1109","author":[{"given":"A.","family":"Matrosova","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Mitrofanov","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"556","article-title":"Detection of Multiple Faults in Combinational Logic Networks","author":"kohavi","year":"1975","journal-title":"IEEE Transasctions on Computers VC-20"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.1993.343020"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2015.7493105"},{"key":"ref5","first-page":"160","article-title":"Circuits without False Paths","author":"matrosova","year":"0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676477"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/EWDTS.2013.6673138"}],"event":{"name":"2016 IEEE East-West Design & Test Symposium (EWDTS)","location":"Yerevan, Armenia","start":{"date-parts":[[2016,10,14]]},"end":{"date-parts":[[2016,10,17]]}},"container-title":["2016 IEEE East-West Design & Test Symposium (EWDTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7794989\/7807620\/07807694.pdf?arnumber=7807694","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,1,21]],"date-time":"2017-01-21T05:10:21Z","timestamp":1484975421000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7807694\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ewdts.2016.7807694","relation":{},"subject":[],"published":{"date-parts":[[2016,10]]}}}