{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:40:00Z","timestamp":1725500400956},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"DOI":"10.1109\/isqed.2006.46","type":"proceedings-article","created":{"date-parts":[[2006,4,6]],"date-time":"2006-04-06T20:21:22Z","timestamp":1144354882000},"page":"330-345","source":"Crossref","is-referenced-by-count":3,"title":["Design of a Single Event Upset (SEU) Mitigation Technique for Programmable Devices"],"prefix":"10.1109","author":[{"given":"S.","family":"Baloch","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Arslan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Stoica","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.1997.699010"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003798"},{"year":"0","key":"1"},{"key":"7","article-title":"Measurement of single-event phenomena in devices and ics","author":"sexton","year":"1992","journal-title":"IEEE Nuclear and Space Radiation Effects Conference Short Course Text"},{"key":"6","article-title":"SEU modeling and prediction techniques","author":"massengill","year":"1993","journal-title":"IEEE Nuclear and Space Radiation Effects Conference Short Course Text"},{"key":"5","article-title":"Single-event analysis and prediction","author":"peterson","year":"1997","journal-title":"IEEE Nuclear and Space Radiation Effects Conference Short Course Text"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/23.212319"},{"key":"9","article-title":"Proton testing of seu mitigation methods for the virtex fpga","author":"carmichael","year":"2001","journal-title":"Proc of MAPLD"},{"key":"8","article-title":"A fault injection analysis of virtex\ufffd fpga tmr design methodology","author":"lima","year":"2001","journal-title":"Proc of (RADECS)"},{"journal-title":"Designing Fault Tolerant Systems","year":"0","author":"lima","key":"11"}],"event":{"name":"7th International Symposium on Quality Electronic Design (ISQED'06)","location":"San Jose, CA, USA"},"container-title":["7th International Symposium on Quality Electronic Design (ISQED'06)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/10740\/33864\/01613158.pdf?arnumber=1613158","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,14]],"date-time":"2017-03-14T14:01:12Z","timestamp":1489500072000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/1613158\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[null]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/isqed.2006.46","relation":{},"subject":[]}}