{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,8,18]],"date-time":"2026-08-18T00:39:19Z","timestamp":1787013559163,"version":"build-2736575974"},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,4]]},"DOI":"10.1109\/vts.2008.27","type":"proceedings-article","created":{"date-parts":[[2008,5,5]],"date-time":"2008-05-05T16:30:16Z","timestamp":1210005016000},"page":"23-28","source":"Crossref","is-referenced-by-count":20,"title":["How Many Test Patterns are Useless?"],"prefix":"10.1109","author":[{"given":"Fran","family":"Ferhani","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Nirmal R.","family":"Saxena","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Edward J.","family":"McCluskey","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Phil","family":"Nigh","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2004.1386954"},{"key":"2","first-page":"34","article-title":"evaluation of test metrics: stuck-at, bridge coverage estimate and gate exhaustive","author":"guo","year":"2006","journal-title":"Proc VLSI Test Symp"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2003.1197631"},{"key":"7","year":"0"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894237"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1988.207814"},{"key":"4","doi-asserted-by":"crossref","first-page":"1050","DOI":"10.1109\/TEST.2002.1041861","article-title":"wafer\/package mix for optimal defect detection","author":"maxwell","year":"2002","journal-title":"Proc Intl Test Conf"},{"key":"9","year":"0"},{"key":"8","year":"0"}],"event":{"name":"26th IEEE VLSI Test Symposium (vts 2008)","location":"San Diego, CA, USA","start":{"date-parts":[[2008,4,27]]},"end":{"date-parts":[[2008,5,1]]}},"container-title":["26th IEEE VLSI Test Symposium (vts 2008)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4511672\/4511673\/04511691.pdf?arnumber=4511691","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T03:53:26Z","timestamp":1497758006000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4511691\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,4]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/vts.2008.27","relation":{},"ISSN":["1093-0167"],"issn-type":[{"value":"1093-0167","type":"print"}],"subject":[],"published":{"date-parts":[[2008,4]]}}}