{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,1]],"date-time":"2026-04-01T17:53:50Z","timestamp":1775066030236,"version":"3.50.1"},"publisher-location":"New Jersey","reference-count":0,"publisher":"IEEE Conference Publications","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013]]},"DOI":"10.7873\/date.2013.363","type":"proceedings-article","created":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T09:33:01Z","timestamp":1372152781000},"page":"1813-1818","source":"Crossref","is-referenced-by-count":8,"title":["D-MRAM Cache: Enhancing Energy Efficiency with 3T-1MTJ DRAM \/ MRAM Hybrid Memory"],"prefix":"10.7873","author":[{"given":"Hiroki","family":"Noguchi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kumiko","family":"Nomura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Keiko","family":"Abe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinobu","family":"Fujita","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eishi","family":"Arima","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kyundong","family":"Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Takashi","family":"Nakada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shinobu","family":"Miwa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Hiroshi","family":"Nakamura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"4628","event":{"name":"Design Automation and Test in Europe","theme":"Design, automation, and test","location":"Grenoble, France","acronym":"DATE13","number":"16","sponsor":["EDAA","CEDA","EDA Consortium","ACM SIGDA","RAS","ECSI"],"start":{"date-parts":[[2013,3,18]]},"end":{"date-parts":[[2013,3,22]]}},"container-title":["Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013"],"original-title":[],"deposited":{"date-parts":[[2013,6,25]],"date-time":"2013-06-25T09:41:51Z","timestamp":1372153311000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/xpl\/articleDetails.jsp?arnumber=6513809"}},"subtitle":[],"proceedings-subject":"Electronic systems design and test","short-title":[],"issued":{"date-parts":[[2013]]},"references-count":0,"URL":"https:\/\/doi.org\/10.7873\/date.2013.363","relation":{},"subject":[],"published":{"date-parts":[[2013]]}}}