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"SCOAP-based Directed Random Test Generation for Combinational Circuits."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Seyyede Maryam Ghasemy et al. (2019)

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DOI: 10.1109/EWDTS.2019.8884405

access: closed

type: Conference or Workshop Paper

metadata version: 2019-11-12

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  dblp key:
  - conf/ewdts/GhasemyRSN19
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  persistent URL:
  - https://dblp.org/rec/conf/ewdts/GhasemyRSN19
Seyyede Maryam Ghasemy, Maryam Rajabalipanah, Saeideh Sarmadi, Zainalabedin Navabi:
SCOAP-based Directed Random Test Generation for Combinational Circuits. EWDTS 2019: 1-5

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last updated on 2019-11-12 10:37 CET by the dblp team

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