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"Production-Ready End-to-End Visual Quality Inspection for Defect Detection ..."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Patrick Trampert et al. (2024)

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DOI: 10.5220/0012536500003720

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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  dblp key:
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  - https://dblp.org/rec/conf/improve/TrampertMSTKW024
Patrick Trampert, Tobias Masiak, Felix Schmidt, Nicolas Thewes, Tim Kruse, Christian Witte, Georg Schneider:
Production-Ready End-to-End Visual Quality Inspection for Defect Detection on Surfaces Based on a Multi-Stage AI System. IMPROVE 2024: 55-66

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last updated on 2024-10-06 21:08 CEST by the dblp team

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