Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method.

Ya-Chi Cheng Pai-Yu Tan Cheng-Wen Wu Ming-Der Shieh Chien-Hui Chuang Gordon Liao Improving Test Quality of Memory Chips by a Decision Tree-Based Screening Method. 601-608 2022 ITC https://doi.org/10.1109/ITC50671.2022.00080 conf/itc/2022 db/conf/itc/itc2022.html#ChengTWSCL22