Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application.

Anwesha Halder Subir Kumar Maity Manoj Kumar Dutta Amit Banerjee Vinay Gupta Rudra Sankar Dhar Performance Reliability of Ge Nanosheet FETs for Gaussian Distribution Channel Incorporating Interface Trap for RF and Analog Application. 2026 93209-93221 14 IEEE Access https://doi.org/10.1109/ACCESS.2026.3705225 db/journals/access/access14.html#HalderMDBGD26 streams/journals/access