<?xml version="1.0" encoding="US-ASCII"?>
<dblp>
<article key="journals/tim/WangLLYWY22" mdate="2022-11-13">
<author orcid="0000-0002-1876-7707">Yalin Wang 0003</author>
<author orcid="0000-0001-8911-6322">Jiang Luo</author>
<author orcid="0000-0003-2983-3105">Chenliang Liu</author>
<author orcid="0000-0002-9072-7179">Xiaofeng Yuan</author>
<author orcid="0000-0003-1396-9825">Kai Wang 0024</author>
<author orcid="0000-0002-3770-9887">Chunhua Yang 0001</author>
<title>Layer-Wise Residual-Guided Feature Learning With Deep Learning Networks for Industrial Quality Prediction.</title>
<pages>1-11</pages>
<year>2022</year>
<volume>71</volume>
<journal>IEEE Trans. Instrum. Meas.</journal>
<ee>https://doi.org/10.1109/TIM.2022.3214611</ee>
<url>db/journals/tim/tim71.html#WangLLYWY22</url>
</article></dblp>
