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Umashankar Samal

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

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2026
[j11]
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Chandan Kumar, Umashankar Samal, Aishwarya Kathroju, Priyanka Kumar, Sunil Kumar Singh:
DeepDefectNet: Estimating software defects with SMOTE and mRMR. Array 31: 101048 (2026)
[j10]
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Chandan Kumar, Umashankar Samal, Tony Jan, Kamran Shaukat, Mukesh Prasad:
Causal modeling in software defect prediction: bridging expert knowledge and novice insight. Autom. Softw. Eng. 33(3): 80 (2026)
[j9]
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Umashankar Samal:
A learning-driven software reliability growth model with maximum fault content and adaptive fault detection. J. Frankl. Inst. 363(10): 108750 (2026)
[j8]
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Shatakshi Singh, Umashankar Samal:
Semantic Communication: Foundations, Current Progress, and Future Pathways. Wirel. Pers. Commun. 146(5): 2687-2710 (2026)
2025
[j7]
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Shatakshi Singh, Umashankar Samal:
Insights and Trends in Open RAN: The Future of Mobile Networks. J. Netw. Syst. Manag. 33(2): 46 (2025)
[j6]
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Umashankar Samal:
Software Reliability Growth Model Considering Imperfect Debugging and Fault Removal Efficiency. Qual. Reliab. Eng. Int. 41(4): 1268-1278 (2025)
[j5]
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Umashankar Samal:
Hybrid Approach to Software Fault Prediction Using Particle Swarm Optimization and Fuzzy Time Series. Qual. Reliab. Eng. Int. 41(5): 2005-2018 (2025)
[j4]
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Umashankar Samal, Ajay Kumar:
Improving software reliability: a hybrid ARIMA-LSTM approach for fault prediction. Int. J. Syst. Assur. Eng. Manag. 16(5): 1757-1769 (2025)
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Umashankar Samal:
Evolution of machine learning and deep learning in intelligent manufacturing: a bibliometric study. Int. J. Syst. Assur. Eng. Manag. 16(9): 3134-3150 (2025)
2024
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Umashankar Samal, Ajay Kumar:
A software reliability model incorporating fault removal efficiency and it's release policy. Comput. Stat. 39(6): 3137-3155 (2024)
[j1]
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Umashankar Samal, Ajay Kumar:
An Enhanced Software Reliability Growth Model Considering Dynamic Fault Removal Efficiency and Residual Error Change Rate. J. Inf. Sci. Eng. 40(6): 1321-1333 (2024)

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