Rana Umar Nadeem·Jun 5Design for Testability: MISR Deep Dive The Mathematics of CompactionThe previous article introduced the MISR as the hardware mechanism that compresses a long response stream into a short final signature. The…
Rana Umar Nadeem·Jun 3Design for Testability: Response Compaction and Signature AnalysisThe previous article closed with the decompressor: a network that takes a small number of external inputs and expands them into a much…
Rana Umar Nadeem·Jun 1Design for Testability: Linear Decompression, XOR Networks, and Pattern ExpansionThe previous article established why compression is not optional. This one explains how it actually works at the architectural level…
Rana Umar Nadeem·May 31Design for Testability: Why Scan Compression Becomes MandatoryThere is a common assumption embedded in how engineers first encounter scan design: that once you have full scan insertion, the hard work…
Rana Umar Nadeem·May 29Design for Testability: Scan Chain Balancing and Physical-Aware StitchingScan gave us access, but access itself has now become expensive.
Harpreet Singh Bedi·Jul 2, 2025Your MBIST Strategy is Broken! Here’s the AI Blueprint to Fix ItHundreds of memories, complex power constraints and insane routing density mean that manually optimizing Memory Built-in Self-Test (MBIST)…
